MCF5270CAB100 Freescale Semiconductor, MCF5270CAB100 Datasheet - Page 539

• Manufacturer Part Number: MCF5270CAB100
• Description: MCU V2 COLDFIRE 64K SRAM 160-QFP
• Manufacturer: Freescale Semiconductor
• Series: MCF527xr

Specifications of MCF5270CAB100

• Core Processor: Coldfire V2
• Core Size: 32-Bit
• Speed: 100MHz
• Connectivity: EBI/EMI, Ethernet, I²C, SPI, UART/USART
• Peripherals: DMA, WDT
• Number Of I /o: 39
• Program Memory Type: ROMless
• Ram Size: 64K x 8
• Voltage - Supply (vcc/vdd): 1.4 V ~ 1.6 V
• Oscillator Type: External
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 160-QFP
• Processor Series: MCF527x
• Core: ColdFire V2
• 3rd Party Development Tools: JLINK-CF-BDM26, EWCF
• Development Tools By Supplier: NNDK-MOD5272-KIT, NNDK-MOD5270-KIT
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Program Memory Size: -
• Data Converters: -
• Lead Free Status / Rohs Status: Details

Chapter 29
IEEE 1149.1 Test Access Port (JTAG)
29.1 Introduction
The Joint Test Action Group, or JTAG, is a dedicated user-accessible test logic, that complies with
the IEEE 1149.1 standard for boundary-scan testability, to help with system diagnostic and
manufacturing testing.
This architecture provides access to all data and chip control pins from the board-edge connector
through the standard four-pin test access port (TAP) and the JTAG reset pin, TRST.
29.1.1 Block Diagram
Figure 29-1
shows the block diagram of the JTAG module.
MCF5271 Reference Manual, Rev. 2
Freescale Semiconductor
29-1