DF3052BX25V Renesas Electronics America, DF3052BX25V Datasheet - Page 632

MCU 5V 512K 100-TQFP

DF3052BX25V

Manufacturer Part Number
DF3052BX25V
Description
MCU 5V 512K 100-TQFP
Manufacturer
Renesas Electronics America
Series
H8® H8/300Hr
Datasheets

Specifications of DF3052BX25V

Core Processor
H8/300H
Core Size
16-Bit
Speed
25MHz
Connectivity
SCI, SmartCard
Peripherals
DMA, POR, PWM, WDT
Number Of I /o
70
Program Memory Size
512KB (512K x 8)
Program Memory Type
FLASH
Ram Size
8K x 8
Voltage - Supply (vcc/vdd)
4.5 V ~ 5.5 V
Data Converters
A/D 8x10b; D/A 2x8b
Oscillator Type
Internal
Operating Temperature
-20°C ~ 75°C
Package / Case
100-TQFP, 100-VQFP
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-

Available stocks

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Part Number
Manufacturer
Quantity
Price
Part Number:
DF3052BX25V
Manufacturer:
Renesas Electronics America
Quantity:
10 000
Section 18 ROM
4. Do not input a constant high level to the FWE pin.
5. Program/erase the flash memory in accordance with the recommended algorithms.
6. Do not set/clear the SWE bit while a program is executing on flash memory.
Rev. 3.00 Mar 21, 2006 page 602 of 814
REJ09B0302-0300
c. In the boot mode, perform FWE pin High/Low switching during reset.
d. In the user program mode, FWE = High/Low switching is possible regardless of the RES
e. Apply an input to FWE when the program is not running away.
f. Release FWE pin input only when the SWE1, ESU1, PSU1, EV1, PV1, E1, and P1 bits in
To prevent erroneous programming/erasing in the event of program runaway, etc., input a high
level to the FWE pin only when programming/erasing flash memory (including flash memory
emulation by RAM). Avoid system configurations that constantly input a high level to the
FWE pin. Handle program runaway, etc. by starting the watchdog timer so that flash memory
is not overprogrammed/overerased even while a high level is input to the FWE pin.
The recommended algorithms can program/erase the flash memory without applying voltage
stress to the device or sacrificing the reliability of the program data.
When setting the PSU1 and ESU1 bits in FLMCR1, or PSU2 and ESU2 bits in FLMCR2 set
the watchdog timer for program runaway, etc.
Accesses to flash memory by means of an MOV instruction, etc., are prohibited while bit
P1/P2 or bit E1/E2 is set.
Before performing flash memory program execution or data read, clear the SWE bit.
If the SWE bit is set, the flash data can be reprogrammed, but flash memory cannot be
accessed for purposes other than verify (verify during programming/erase).
In transition to the boot mode, input FWE = High level and set MD
input is low. At this time, the FWE and MD
programming setup time (t
setup time is necessary for RES reset timing even in transition from the boot mode to
another mode.
In reset during operation, the RES pin must be held at a low level for at least 20 system
clocks.
input.
FWE input switching is also possible during program execution on flash memory.
When applying an input to the FWE pin, the program execution state must be supervised
using a watchdog timer, etc.
FLMCR1, and the SWE2, ESU2, PSU2, EV2, PV2, E2, and P2 bits in FLMCR2, are
cleared.
Do not erroneously set any of bits SWE1, ESU1, PSU1, EV1, PV1, E1, P1, SWE2, ESU2,
PSU2, EV2, PV2, E2, or P2 when applying or releasing FWE.
MDS
) relative to the reset clear timing. The mode programming
2
to MD
0
inputs must satisfy the mode
2
to MD
0
while the RES

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