DF3052BX25V Renesas Electronics America, DF3052BX25V Datasheet - Page 667

MCU 5V 512K 100-TQFP

DF3052BX25V

Manufacturer Part Number
DF3052BX25V
Description
MCU 5V 512K 100-TQFP
Manufacturer
Renesas Electronics America
Series
H8® H8/300Hr
Datasheets

Specifications of DF3052BX25V

Core Processor
H8/300H
Core Size
16-Bit
Speed
25MHz
Connectivity
SCI, SmartCard
Peripherals
DMA, POR, PWM, WDT
Number Of I /o
70
Program Memory Size
512KB (512K x 8)
Program Memory Type
FLASH
Ram Size
8K x 8
Voltage - Supply (vcc/vdd)
4.5 V ~ 5.5 V
Data Converters
A/D 8x10b; D/A 2x8b
Oscillator Type
Internal
Operating Temperature
-20°C ~ 75°C
Package / Case
100-TQFP, 100-VQFP
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-

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Company
Part Number
Manufacturer
Quantity
Price
Part Number:
DF3052BX25V
Manufacturer:
Renesas Electronics America
Quantity:
10 000
Item
Read data access time 3
Read data access time 4
Precharge time
Wait setup time
Wait hold time
Bus request setup ime
Bus acknowledge delay time 1
Bus acknowledge delay time 2
Bus-floating time
Table 21.5 Refresh Controller Bus Timing
Conditions:
Item
RAS delay time 1
RAS delay time 2
RAS delay time 3
Row address hold time *
RAS precharge time *
CAS to RAS precharge time *
CAS pulse width
RAS access time *
Address access time
CAS access time *
Write data setup time 3
CAS setup time *
Read strobe delay time
V
V
CC
SS
= AV
= 5.0 V ±10%, AV
SS
= 0 V, = 2 MHz to 25 MHz, T
Symbol
t
t
t
t
t
t
t
t
t
Symbol
t
t
t
t
t
t
t
t
t
t
t
t
t
ACC3
ACC4
PCH
WTS
WTH
BRQS
BACD1
BACD2
BZD
RAD1
RAD2
RAD3
RAH
RP
CRP
CAS
RAC
AA
CAC
WDS3
CSR
RSD
CC
= 5.0 V ±10%, V
Min
1.0 t
25
5
25
Min
0.5 t
1.0 t
1.0 t
1.0 t
15
0.5 t
cyc
cyc
cyc
cyc
cyc
cyc
- 20
- 5
- 15
- 15
- 18
- 15
Conditions
Conditions
Rev. 3.00 Mar 21, 2006 page 637 of 814
REF
a
Max
1.0 t
2.0 t
30
30
40
Max
18
18
18
2.0 t
1.5 t
1.0 t
25
= –20°C to +75°C
Section 21 Electrical Characteristics
= 4.5 V to AV
cyc
cyc
cyc
cyc
cyc
- 28
- 32
- 35
- 40
- 30
Unit
ns
Unit
ns
CC
,
REJ09B0302-0300
Test
Conditions
Figure 21.4,
Figure 21.5
Figure 21.6
Figure 21.17
Test
Conditions
Figure 21.7 to
Figure 21.14

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