R5S77631Y266BGV Renesas Electronics America, R5S77631Y266BGV Datasheet - Page 1872
R5S77631Y266BGV
Manufacturer Part Number
R5S77631Y266BGV
Description
IC SUPERH MPU ROMLESS 499BGA
Manufacturer
Renesas Electronics America
Series
SuperH® SH7780r
Datasheet
1.R5S77631Y266BGV.pdf
(2056 pages)
Specifications of R5S77631Y266BGV
Core Processor
SH-4A
Core Size
32-Bit
Speed
266MHz
Connectivity
Audio Codec, I²C, MMC, SCI, SIM, SIO, SSI, USB
Peripherals
DMA, LCD, POR, WDT
Number Of I /o
107
Program Memory Type
ROMless
Ram Size
16K x 8
Voltage - Supply (vcc/vdd)
1.15 V ~ 1.35 V
Data Converters
A/D 4x10b; D/A 2x8b
Oscillator Type
External
Operating Temperature
-20°C ~ 75°C
Package / Case
499-BGA
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Program Memory Size
-
Available stocks
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Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
R5S77631Y266BGV
Manufacturer:
Renesas Electronics America
Quantity:
10 000
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Section 42 User Debugging Interface (H-UDI)
The TCK clock or the CPG of this LSI should be set to ensure that the frequency of the TCK clock
is less than the peripheral-clock frequency of this LSI.
42.3
The H-UDI contains two separate TAP controllers: one for controlling the boundary-scan function
and another for controlling the H-UDI reset and interrupt functions. Assertion of TRST, for
example at power-on reset, activates the boundary-scan TAP controller and enables the boundary-
scan function prescribed in the JTAG standards. Executing a switchover command to the H-UDI
allows usage of the H-UDI reset and H-UDI interrupts. This LSI, however, has the following
limitations:
• Clock-related pins (EXTAL, XTAL, EXTAL2, and XTAL2) are out of the scope of the
• Reset-related pins (PRESET, MRESET) are out of the scope of the boundary-scan test.
• H-UDI-related pins (TCK, TDI, TDO, TMS, TRST and MPMD) are out of the scope of the
• DDRIF-related pins are out of the scope of the boundary-scan test
• XRTCTBI, USBP, USBM, DA0, DA1, and AN0 to AN3 pins are out of the scope of the
• During the boundary scan (IDCODE, EXTEST, SAMPLE/PRELOAD, BYPASS, and H-UDI
• The external controller has 8-bit access to the boundary-scan TAP controller via the H-UDI.
Note: During the boundary scan, the PRESET pin should be fixed high-level.
Table 42.2 shows the commands supported by the boundary-scan TAP controller.
Rev. 2.00 May 22, 2009 Page 1802 of 1982
REJ09B0256-0200
boundary-scan test.
boundary-scan test.
boundary-scan test
switchover command), the maximum TCK signal frequency is 2 MHz.
3. This pin should be connected to ground, the PRESET, or another pin which operates in
Boundary Scan TAP Controllers (IDCODE, EXTEST,
SAMPLE/PRELOAD, and BYPASS)
the same manner as the PRESET pin. However, when connected to a ground pin, the
following problem occurs. Since the TRST pin is pulled up within this LSI, a weak
current flows when the pin is externally connected to ground pin. The value of the
current is determined by a resistance of the pull-up MOS for the port pin. Although this
current does not affect the operation of this LSI, it consumes unnecessary power.
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